Dielectric measurements using the HP 85070A probe

Author

Wu, Wenliang ; Smith, Charles E.

Author_Institution

Dept. of Electr. Eng., Mississippi Univ., MS, USA

fYear

1992

fDate

12-15 Apr 1992

Firstpage

83

Abstract

The authors describe the techniques for permittivity measurements using the Hewlett Packard HP 85070A Dielectric Probe Kit. The HP 85070A probe provides a flexible means of dielectric measurements with only minimum sample preparation. Results from measurements of the dielectric constant of liquids and solids are presented for dielectric constants ranging from 2.5 to 80 and for lossless and lossy materials. The focus is on techniques for sample measurements and the accuracy, repeatability, and resolution obtained with this HP probe for performance characterization and evaluation

Keywords

computerised instrumentation; dielectric properties of liquids and solutions; dielectric properties of solids; electric sensing devices; microcomputer applications; microwave measurement; permittivity measurement; physics computing; probes; 200 MHz to 20 GHz; Hewlett Packard HP 85070A Dielectric Probe Kit; IBM-PC/AT; accuracy; dielectric measurements; liquids; lossless materials; lossy materials; permittivity measurements; repeatability; resolution; solids; Calibration; Coaxial components; Dielectric constant; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Frequency; Permittivity measurement; Probes; Solids;

fLanguage

English

Publisher

ieee

Conference_Titel

Southeastcon '92, Proceedings., IEEE

Conference_Location

Birmingham, AL

Print_ISBN

0-7803-0494-2

Type

conf

DOI

10.1109/SECON.1992.202313

Filename

202313