DocumentCode
306891
Title
An inspection strategy for randomly failing machine to guarantee robust schedules
Author
Chelbi, Anis ; Ait-Kadi, Daoud ; Ramudhin, Amar
Author_Institution
Dept. of Mech. Eng., Laval Univ., Que., Canada
Volume
1
fYear
1996
fDate
18-21 Nov 1996
Firstpage
248
Abstract
This paper is motivated by the availability improvement of a single randomly failing machine whose state is only known through inspection. Jobs to be processed on the machine arrive according to a random distribution and the processing of each job induces a shock whose magnitude depends on the job´s desired operating characteristics. These shocks cumulatively aggravate the deterioration process and hasten machine failure. The machine is inspected at predetermined times T1 , T2, ... . If failure is detected then the machine is repaired as good as new, otherwise it is kept operating. Given a prespecified availability level for the machine, the corresponding inspection sequence is determined and the scheduler builds his schedule around the inspection points. The expression of the system time-stationary availability is presented and an algorithm has been developed to generate the inspection sequence which insures a certain machine availability level. In cases where the inspection period is predetermined due to limited resources, the computer program determines the maximum job arrival rate not to be exceeded in order to guarantee a minimum required machine availability level. Numerical results are provided for a test case
Keywords
inspection; random processes; reliability theory; guaranteed robust schedules; inspection sequence; inspection strategy; maximum job arrival rate; randomly failing machine; system time-stationary availability; Availability; Electric shock; Inspection; Mechanical engineering; Process planning; Processor scheduling; Robustness; Scheduling algorithm; Stochastic processes; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Technologies and Factory Automation, 1996. EFTA '96. Proceedings., 1996 IEEE Conference on
Conference_Location
Kauai, HI
Print_ISBN
0-7803-3685-2
Type
conf
DOI
10.1109/ETFA.1996.573300
Filename
573300
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