DocumentCode :
3069566
Title :
Open/folded bit-line arrangement for ultra high-density DRAMs
Author :
Takashima, D. ; Watanabe, S. ; Sakui, K. ; Nakano, H. ; Ohuchi, K.
Author_Institution :
ULSI Res. Center, Toshiba Corp., Kawasaki, Japan
fYear :
1993
fDate :
19-21 May 1993
Firstpage :
89
Lastpage :
90
Abstract :
A new open/folded bit-line (BL) arrangement for ultra high-density DRAMs is proposed. The proposed arrangement was successfully verified by the test chip. This arrangement features a 6F/sup 2/ memory cell and relaxed sensing amplifier of 3 times the pitch of BL. The chip size with this arrangement can be reduced to 81.6% of that of the folded BL arrangement, without introducing the complicated memory cell structure and without sacrificing access speed and power dissipation. Moreover, the proposed arrangement has good array noise immunity in scaled DRAMs compared with the folded BL arrangement. This arrangement is one of the leading candidates for ultra high-density DRAMs.
Keywords :
DRAM chips; MOS integrated circuits; VLSI; 6F/sup 2/ memory cell; array noise immunity; dynamic RAM; open/folded bit-line arrangement; sensing amplifier; ultra high-density DRAMs; DRAM chips; Integrated circuit noise; MOS integrated circuits, memory; Ultra-large-scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
Type :
conf
DOI :
10.1109/VLSIC.1993.920551
Filename :
920551
Link To Document :
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