DocumentCode
3072086
Title
Error Exponent Analysis of Energy-Based Bayesian Spectrum Sensing under Fading Channels
Author
Gurugopinath, Sanjeev ; Murthy, Chandra R. ; Sharma, Vinod
Author_Institution
Dept. of ECE, Indian Inst. of Sci., Bangalore, India
fYear
2011
fDate
5-9 Dec. 2011
Firstpage
1
Lastpage
5
Abstract
This paper analyzes the error exponents in Bayesian decentralized spectrum sensing, i.e., the detection of occupancy of the primary spectrum by a cognitive radio, with probability of error as the performance metric. At the individual sensors, the error exponents of a Central Limit Theorem (CLT) based detection scheme are analyzed. At the fusion center, a K-out-of-N rule is employed to arrive at the overall decision. It is shown that, in the presence of fading, for a fixed number of sensors, the error exponents with respect to the number of observations at both the individual sensors as well as at the fusion center are zero. This motivates the development of the error exponent with a certain probability as a novel metric that can be used to compare different detection schemes in the presence of fading. The metric is useful, for example, in answering the question of whether to sense for a pilot tone in a narrow band (and suffer Rayleigh fading) or to sense the entire wide-band signal (and suffer log-normal shadowing), in terms of the error exponent performance. The error exponents with a certain probability at both the individual sensors and at the fusion center are derived, with both Rayleigh as well as log-normal shadow fading. Numerical results are used to illustrate and provide a visual feel for the theoretical expressions obtained.
Keywords
Rayleigh channels; cognitive radio; error analysis; Rayleigh fading; central limit theorem; cognitive radio; energy based Bayesian spectrum sensing; error exponent analysis; fading channels; fusion center; Bayesian methods; Niobium; Rayleigh channels; Sensor fusion; Shadow mapping;
fLanguage
English
Publisher
ieee
Conference_Titel
Global Telecommunications Conference (GLOBECOM 2011), 2011 IEEE
Conference_Location
Houston, TX, USA
ISSN
1930-529X
Print_ISBN
978-1-4244-9266-4
Electronic_ISBN
1930-529X
Type
conf
DOI
10.1109/GLOCOM.2011.6133721
Filename
6133721
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