Adaptive De-noising Filter Algorithm for CMOS Image Sensor Testing Applications

This paper proposes an adaptive de-nosing filter (ADF) algorithm to effectively remove the image defects for the CMOS image sensor testing applications. Based on the median filter technique, the proposed ADF algorithm develops a pre-processing method to generate adaptive detection windows for pixel defect de-noising of an image. Experimental results and comparisons show that the proposed ADF algorithm can provide a significant ability of defects de-noising for supporting good performance in peak signal-to-noise ratio (PSNR) and image quality.