DocumentCode
3072650
Title
The Micromagnetics Of Defects In Film Stacks With Interlayer Exchange Coupling
Author
van den Berg, H.A.M. ; Schmeusser, S.
Author_Institution
Siemens AG, Erlangen, Bavaria, P.O. Box 3220, Fed. Rep. Germany
fYear
1993
fDate
13-16 April 1993
Keywords
Anisotropic magnetoresistance; Boundary conditions; Couplings; Magnetic anisotropy; Magnetic confinement; Magnetic domain walls; Magnetic hysteresis; Micromagnetics; Perpendicular magnetic anisotropy; Saturation magnetization;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1993. INTERMAG '93., Digest of International
Conference_Location
Stockhom, Sweden
Print_ISBN
0-7803-1310-0
Type
conf
DOI
10.1109/INTMAG.1993.642020
Filename
642020
Link To Document