• DocumentCode
    3073170
  • Title

    Test Selection Policies for Faster Incremental Fault Detection

  • Author

    Amati, L. ; Bolchini, C. ; Salice, F.

  • Author_Institution
    Dip. Elettron. e Inf., Politec. di Milano, Milan, Italy
  • fYear
    2010
  • fDate
    6-8 Oct. 2010
  • Firstpage
    310
  • Lastpage
    318
  • Abstract
    Incremental Automatic Functional Fault Detective is an incremental methodology based on a Bayesian Belief Network for the identification of the faulty component in a complex system, using data collected from a test session. Incremental Automatic Functional Fault Detective reduces time, cost and efforts during the diagnostic phase by implementing a step-by-step selection of the tests to be executed from the set of available tests. This paper focuses on the evolution of the Bayesian Belief Network nodes probabilities, presenting some selection heuristics to reduce the number of required tests. Validation is performed on a set of experimental results.
  • Keywords
    belief networks; fault tolerant computing; program verification; Bayesian belief network; faulty component; incremental automatic functional fault detection; test execution; Bayesian methods; Complexity theory; Computational modeling; FCC; Fault detection; Measurement; Probabilistic logic; Bayesian Network; Diagnosis Accuracy; Fault Detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4244-8447-8
  • Type

    conf

  • DOI
    10.1109/DFT.2010.45
  • Filename
    5634923