DocumentCode
3073170
Title
Test Selection Policies for Faster Incremental Fault Detection
Author
Amati, L. ; Bolchini, C. ; Salice, F.
Author_Institution
Dip. Elettron. e Inf., Politec. di Milano, Milan, Italy
fYear
2010
fDate
6-8 Oct. 2010
Firstpage
310
Lastpage
318
Abstract
Incremental Automatic Functional Fault Detective is an incremental methodology based on a Bayesian Belief Network for the identification of the faulty component in a complex system, using data collected from a test session. Incremental Automatic Functional Fault Detective reduces time, cost and efforts during the diagnostic phase by implementing a step-by-step selection of the tests to be executed from the set of available tests. This paper focuses on the evolution of the Bayesian Belief Network nodes probabilities, presenting some selection heuristics to reduce the number of required tests. Validation is performed on a set of experimental results.
Keywords
belief networks; fault tolerant computing; program verification; Bayesian belief network; faulty component; incremental automatic functional fault detection; test execution; Bayesian methods; Complexity theory; Computational modeling; FCC; Fault detection; Measurement; Probabilistic logic; Bayesian Network; Diagnosis Accuracy; Fault Detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location
Kyoto
ISSN
1550-5774
Print_ISBN
978-1-4244-8447-8
Type
conf
DOI
10.1109/DFT.2010.45
Filename
5634923
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