DocumentCode
3073358
Title
Transient Fault and Soft Error On-die Monitoring Scheme
Author
Rossi, Daniele ; Omaña, Martin ; Metra, Cecilia
Author_Institution
Dept. of Electron. & Comput. Sci. (DEIS), Univ. of Bologna, Bologna, Italy
fYear
2010
fDate
6-8 Oct. 2010
Firstpage
391
Lastpage
398
Abstract
In this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC.
Keywords
fault diagnosis; flip-flops; transient analysis; data-path latches; flip-flop; on-die monitoring; power consumption; soft error; transient fault count; transient fault detection; Delay; Detectors; Flip-flops; Latches; Logic gates; Monitoring; Silicon; early monitoring scheme; soft errors; transient faults;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location
Kyoto
ISSN
1550-5774
Print_ISBN
978-1-4244-8447-8
Type
conf
DOI
10.1109/DFT.2010.53
Filename
5634938
Link To Document