مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3073578

Title :

Author index

fYear :

2010

fDate :

6-8 Oct. 2010

Firstpage :

447

Lastpage :

449

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on

Conference_Location :

Kyoto

ISSN :

1550-5774

Print_ISBN :

978-1-4244-8447-8

Type :

conf

DOI :

10.1109/DFT.2010.62

Filename :

5634950

Link To Document :