• DocumentCode
    3073585
  • Title

    Wavelet approach to artifact noise removal from Capacitive coupled Electrocardiograph

  • Author

    Min Lee, Seung ; Keun Kim, Ko ; Park, Kwang Suk

  • Author_Institution
    Interdisciplinary Program of Bioengineering, Seoul National University, Graduate School, Republic of Korea
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    2944
  • Lastpage
    2947
  • Abstract
    Capacitive coupled Electrocardiography (ECG) is introduced as non-invasive measurement technology for ubiquitous health care and appliance are spread out widely. Although it has many merits, however, capacitive coupled ECG is very weak for motion artifacts for its non-skin-contact property. There are many studies for artifact problems which treats all artifact signals below 0.8Hz. In our capacitive coupled ECG measurement system, artifacts exist not only below 0.8Hz but also over than 10Hz. Therefore, artifact noise removal algorithm using wavelet method is tested to reject artifact-wandered signal from measured signals. It is observed that using power calculation each decimation step, artifact-wandered signal is removed as low frequency artifacts as high frequency artifacts. Although some original ECG signal is removed with artifact signal, we could level the signal quality for long term measure which shows the best quality ECG signals as we can get.
  • Keywords
    Biomedical engineering; Biomedical measurements; Current measurement; Displacement measurement; Electric variables measurement; Electrocardiography; Electrodes; Frequency; Medical services; Skin; Algorithms; Artifacts; Biomedical Engineering; Diagnosis, Computer-Assisted; Electric Capacitance; Electric Conductivity; Electrocardiography; Electrodes; Humans; Models, Statistical; Motion; Reproducibility of Results; Signal Processing, Computer-Assisted; Subtraction Technique; Time Factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4649820
  • Filename
    4649820