DocumentCode
3073585
Title
Wavelet approach to artifact noise removal from Capacitive coupled Electrocardiograph
Author
Min Lee, Seung ; Keun Kim, Ko ; Park, Kwang Suk
Author_Institution
Interdisciplinary Program of Bioengineering, Seoul National University, Graduate School, Republic of Korea
fYear
2008
fDate
20-25 Aug. 2008
Firstpage
2944
Lastpage
2947
Abstract
Capacitive coupled Electrocardiography (ECG) is introduced as non-invasive measurement technology for ubiquitous health care and appliance are spread out widely. Although it has many merits, however, capacitive coupled ECG is very weak for motion artifacts for its non-skin-contact property. There are many studies for artifact problems which treats all artifact signals below 0.8Hz. In our capacitive coupled ECG measurement system, artifacts exist not only below 0.8Hz but also over than 10Hz. Therefore, artifact noise removal algorithm using wavelet method is tested to reject artifact-wandered signal from measured signals. It is observed that using power calculation each decimation step, artifact-wandered signal is removed as low frequency artifacts as high frequency artifacts. Although some original ECG signal is removed with artifact signal, we could level the signal quality for long term measure which shows the best quality ECG signals as we can get.
Keywords
Biomedical engineering; Biomedical measurements; Current measurement; Displacement measurement; Electric variables measurement; Electrocardiography; Electrodes; Frequency; Medical services; Skin; Algorithms; Artifacts; Biomedical Engineering; Diagnosis, Computer-Assisted; Electric Capacitance; Electric Conductivity; Electrocardiography; Electrodes; Humans; Models, Statistical; Motion; Reproducibility of Results; Signal Processing, Computer-Assisted; Subtraction Technique; Time Factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
Conference_Location
Vancouver, BC
ISSN
1557-170X
Print_ISBN
978-1-4244-1814-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2008.4649820
Filename
4649820
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