• DocumentCode
    3074052
  • Title

    Self Acquiring Image Knowledge Using Maximum Value Metric based Self Organizing Maps

  • Author

    Indra, N. Chenthalir ; Ramaraj, E.

  • Author_Institution
    S.T. Hindu Coll., Nagercoil
  • fYear
    2009
  • fDate
    6-7 March 2009
  • Firstpage
    649
  • Lastpage
    653
  • Abstract
    Mining images means extracting patterns and derive knowledge from large collections of images. Image mining follows image feature gathering, learning and retrieving procedures. This paper apprises as to what extent the users of the self organizing maps(SOM) techniques are satisfied with its efficiency of visualizing and organizing large amounts of image data. The main contribution of the paper consists of identifying factor that influences the quality of SOM The result analysis shows that, SOM learning capacity is sensitive to initial weight vector, Learning rate, number of epochs for training and distance measure to select winning neuron. The result affirms that among all theses features distance measure factor has high rate of impact in SOM clustering. Euclidian measure is substituted by the Linfin norm (maximum value distance) measure of Minkowski r_metric. Maximum value distance based SOM exhibits both accurate functionality and image mining feasibility.
  • Keywords
    data mining; feature extraction; image processing; pattern clustering; self-organising feature maps; Euclidian measure; Minkowski r_metric; SOM clustering; image mining; maximum value metric; pattern extraction; self acquiring image knowledge; self organizing maps; Computer science; Data mining; Data visualization; Educational institutions; Electric variables measurement; Image retrieval; Internet; Knowledge engineering; Neurons; Self organizing feature maps; Self organizing maps; epochs; learning rate; maximum value measure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advance Computing Conference, 2009. IACC 2009. IEEE International
  • Conference_Location
    Patiala
  • Print_ISBN
    978-1-4244-2927-1
  • Electronic_ISBN
    978-1-4244-2928-8
  • Type

    conf

  • DOI
    10.1109/IADCC.2009.4809088
  • Filename
    4809088