Title :
A Large-Scale Industrial Case Study on Architecture-Based Software Reliability Analysis
Author :
Koziolek, Heiko ; Schlich, Bastian ; Bilich, Carlos
Author_Institution :
Ind. Software Syst., ABB Corp. Res., Ladenburg, Germany
Abstract :
Architecture-based software reliability analysis methods shall help software architects to identify critical software components and to quantify their influence on the system reliability. Although researchers have proposed more than 20 methods in this area, empirical case studies applying these methods on large-scale industrial systems are rare. The costs and benefits of these methods remain unknown. On this behalf, we have applied the Cheung method on the software architecture of an industrial control system from ABB consisting of more than 100 components organized in nine subsystems with more than three million lines of code. We used the Littlewood/Verrall model to estimate subsystems failure rates and logging data to derive subsystem transition probabilities. We constructed a discrete time Markov chain as an architectural model and conducted a sensitivity analysis. This paper summarizes our experiences and lessons learned. We found that architecture-based software reliability analysis is still difficult to apply and that more effective data collection techniques are required.
Keywords :
Markov processes; discrete time systems; industrial control; software architecture; software reliability; system monitoring; systems analysis; Cheung method; Littlewood model; Verrall model; architecture based software reliability analysis; data logging; discrete time Markov chain; industrial control system; large scale industrial system; software architecture; subsystems failure rates estimation; Analytical models; Computational modeling; Data models; Markov processes; Software; Software reliability; Markov processes; Software reliability growth; software architecture;
Conference_Titel :
Software Reliability Engineering (ISSRE), 2010 IEEE 21st International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-9056-1
Electronic_ISBN :
1071-9458
DOI :
10.1109/ISSRE.2010.15