• DocumentCode
    3075409
  • Title

    The Impact of Coupling on the Fault-Proneness of Aspect-Oriented Programs: An Empirical Study

  • Author

    Burrows, Rachel ; Ferrari, Fabiano C. ; Lemos, Otávio A L ; Garcia, Alessandro ; Taïani, François

  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    329
  • Lastpage
    338
  • Abstract
    Coupling in software applications is often used as an indicator of external quality attributes such as fault-proneness. In fact, the correlation of coupling metrics and faults in object oriented programs has been widely studied. However, there is very limited knowledge about which coupling properties in aspect-oriented programming (AOP) are effective indicators of faults in modules. Existing coupling metrics do not take into account the specificities of AOP mechanisms. As a result, these metrics are unlikely to provide optimal predictions of pivotal quality attributes such as fault-proneness. This impacts further by restraining the assessments of AOP empirical studies. To address these issues, this paper presents an empirical study to evaluate the impact of coupling sourced from AOP-specific mechanisms. We utilise a novel set of coupling metrics to predict fault occurrences in aspect-oriented programs. We also compare these new metrics against previously proposed metrics for AOP. More specifically, we analyse faults from several releases of three AspectJ applications and perform statistical analyses to reveal the effectiveness of these metrics when predicting faults. Our study shows that a particular set of fine-grained directed coupling metrics have the potential to help create better fault prediction models for AO programs.
  • Keywords
    aspect-oriented programming; software metrics; software quality; statistical analysis; AspectJ applications; aspect-oriented programming; coupling impact; coupling metrics; fault-proneness attribute; statistical analysis; Couplings; Electronic mail; Java; Measurement; Programming; Servers; Software; Aspect-Oriented Progamming; Coupling Metrics; Fault-Proneness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering (ISSRE), 2010 IEEE 21st International Symposium on
  • Conference_Location
    San Jose, CA
  • ISSN
    1071-9458
  • Print_ISBN
    978-1-4244-9056-1
  • Electronic_ISBN
    1071-9458
  • Type

    conf

  • DOI
    10.1109/ISSRE.2010.33
  • Filename
    5635061