• DocumentCode
    3080696
  • Title

    EOG artifact minimization using oblique projection corrected eigenvector decomposition

  • Author

    Zhou, Ziling ; Puthusserypady, Sadasivan

  • Author_Institution
    Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576, Singapore
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    4656
  • Lastpage
    4659
  • Abstract
    In this paper, the authors propose an efficient algorithm to minimize the electrooculogram (EOG) artifacts in electroencephalogram (EEG). The approach uses the eigenvectors obtained from a learning process to initialize an oblique projection based blind source extraction (BSE) algorithm. It is used to extract the point source EOG artifacts. EEG data is subsequently reconstructed by a deflation method. The simulations with synthetic data illustrate that the BSE corrected algorithm is reliable and has better performance than the uncorrected eigenvector decomposition based method. The results of simulations with real EEG data confirms the effectiveness of our algorithm.
  • Keywords
    Bioelectric phenomena; Brain modeling; Chromium; Covariance matrix; Data mining; Electrodes; Electroencephalography; Electrooculography; Independent component analysis; Minimization methods; Algorithms; Artifacts; Brain; Computer Simulation; Electroencephalography; Electrooculography; Humans; Models, Biological; Models, Statistical; Monte Carlo Method; Neurons; Reproducibility of Results; Signal Processing, Computer-Assisted; Time Factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4650251
  • Filename
    4650251