DocumentCode :
3082577
Title :
An enhanced empirical large signal model of SiC MESFETs for power applications
Author :
Sayed, Ahmed ; Boeck, Georg
Author_Institution :
Microwave Eng. Group, Technische Univ. Berlin, Germany
fYear :
2005
fDate :
25-28 July 2005
Firstpage :
28
Lastpage :
31
Abstract :
In this paper, a large signal table-based model for SiC MESFET is presented. A packaged commercially available high power MESFET device (CREE CRF24010) is adopted for the model development. The extracted bias-dependent elements of the small signal model as well as the measured DC data are mathematically described by small modification of Angelov´s formulation. Dispersion between DC and RF characteristics of the drain current is also observed and interpreted. The new model is capable to predict small signal as well as large signal performance accurately. A single stage ultra broadband 5 W power amplifier has been developed to verify the derived model. A good agreement has been obtained between simulated and measured results.
Keywords :
power MESFET; semiconductor device models; silicon compounds; wide band gap semiconductors; MESFET; SiC; drain current; power amplifier; power applications; Broadband amplifiers; Data mining; MESFETs; Mathematical model; Packaging; Power amplifiers; Predictive models; Radio frequency; Radiofrequency amplifiers; Silicon carbide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Optoelectronics, 2005 SBMO/IEEE MTT-S International Conference on
Print_ISBN :
0-7803-9341-4
Type :
conf
DOI :
10.1109/IMOC.2005.1580056
Filename :
1580056
Link To Document :
بازگشت