DocumentCode :
3082644
Title :
Progress on Ion Beam Modulation Technique for Time-Dependent Analytical Instruments
Author :
Jingjing, Zhang ; Xiaolin, Qiao
Author_Institution :
Inst. of Inf. & Eng., Harbin Inst. of Technol. at Weihai, Weihai, China
fYear :
2010
fDate :
17-19 Sept. 2010
Firstpage :
787
Lastpage :
790
Abstract :
Both Time-of-flight (TOF) mass spectrometry and ion mobility spectrometry (IMS) are time-dependent analytical instruments which need to quickly and efficiently chop continuous ion beam into small packets for separation based on ion gates device. The effect of ion beam modulation technique can affect to some extent the performance of these instruments, such as resolution or sensitivity. So ion gates are a very important component of these instruments and ion beam modulation methods are key technique of such instruments. This review provides a development of ion beam modulation methods based on ion gates in TOF and IMS and a performance comparison between them.
Keywords :
time of flight mass spectrometers; time of flight mass spectroscopy; IMS; TOF mass spectometry; ion beam modulation technique; ion gates; ion mobility spectrometry; time-dependent analytical instruments; time-of-flight mass spectrometry; Instruments; Ion beams; Logic gates; Modulation; Spectroscopy; Transforms; Wire; BNG; IMS; TOFMS; ion beam modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pervasive Computing Signal Processing and Applications (PCSPA), 2010 First International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-8043-2
Electronic_ISBN :
978-0-7695-4180-8
Type :
conf
DOI :
10.1109/PCSPA.2010.196
Filename :
5635614
Link To Document :
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