DocumentCode
3083136
Title
Thermal modeling, analysis, and management of high-power GaN transistors
Author
Wen-Sheng Zhao ; Sen-Sen Li ; Rui Zhang ; Wen-Yan Yin
Author_Institution
State Key Lab. of MOI, Zhejiang Univ., Hangzhou, China
fYear
2013
fDate
12-15 Dec. 2013
Firstpage
241
Lastpage
244
Abstract
A thermal circuit model for high power GaN transistor is constructed in this paper. Based on this model, the temperature rise in GaN transistor can be fast captured accurately. Further, the graphene layer is inserted below GaN layer to serve as heat spreader. It has been demonstrated that by introducing graphene layer, the maximum temperature rise of GaN transistor can be effectively suppressed, and its performance and reliability can be thereby improved.
Keywords
III-V semiconductors; field effect transistors; gallium compounds; power semiconductor devices; semiconductor device packaging; thermal analysis; thermal management (packaging); wide band gap semiconductors; GaN; graphene layer; heat spreader; high power transistors; temperature rise; thermal analysis; thermal management; thermal modeling; transistor performance; transistor reliability; Decision support systems; Noise measurement; Packaging; High-power GaN transistor; graphene; themral circuit model; thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2013 IEEE
Conference_Location
Nara
Print_ISBN
978-1-4799-2313-7
Type
conf
DOI
10.1109/EDAPS.2013.6724434
Filename
6724434
Link To Document