• DocumentCode
    3083136
  • Title

    Thermal modeling, analysis, and management of high-power GaN transistors

  • Author

    Wen-Sheng Zhao ; Sen-Sen Li ; Rui Zhang ; Wen-Yan Yin

  • Author_Institution
    State Key Lab. of MOI, Zhejiang Univ., Hangzhou, China
  • fYear
    2013
  • fDate
    12-15 Dec. 2013
  • Firstpage
    241
  • Lastpage
    244
  • Abstract
    A thermal circuit model for high power GaN transistor is constructed in this paper. Based on this model, the temperature rise in GaN transistor can be fast captured accurately. Further, the graphene layer is inserted below GaN layer to serve as heat spreader. It has been demonstrated that by introducing graphene layer, the maximum temperature rise of GaN transistor can be effectively suppressed, and its performance and reliability can be thereby improved.
  • Keywords
    III-V semiconductors; field effect transistors; gallium compounds; power semiconductor devices; semiconductor device packaging; thermal analysis; thermal management (packaging); wide band gap semiconductors; GaN; graphene layer; heat spreader; high power transistors; temperature rise; thermal analysis; thermal management; thermal modeling; transistor performance; transistor reliability; Decision support systems; Noise measurement; Packaging; High-power GaN transistor; graphene; themral circuit model; thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2013 IEEE
  • Conference_Location
    Nara
  • Print_ISBN
    978-1-4799-2313-7
  • Type

    conf

  • DOI
    10.1109/EDAPS.2013.6724434
  • Filename
    6724434