DocumentCode
3083162
Title
Soft Errors: Technology Trends, System Effects, and Protection Techniques
Author
Mitra, Subhasish ; Sanda, Pia ; Seifert, Norbert
Author_Institution
Stanford University
fYear
2007
fDate
8-11 July 2007
Firstpage
4
Lastpage
4
Abstract
Radiation-induced soft errors are getting worse in digital systems manufactured in advanced technologies. Stringent data integrity and availability requirements of enterprise computing and networking applications demand special attention to soft errors in sequential elements and combinational logic. This tutorial will discuss the impact of technology scaling on soft error rates, circuit-level modeling of soft errors, architectural impact of soft errors, challenges associated with evaluation of run-time behaviors of systems in the presence of soft errors, actual data on system behaviors in the presence of soft errors, metrics for quantifying soft error vulnerabilities, design of architectures with Built-in-Soft-Error-Resilience techniques, and actual case studies.
Keywords
Computer Society; Computer science education; Educational programs; Educational technology; Error correction codes; Josephson junctions; Logic testing; National electric code; Protection; Technical Councils; Built-In Soft Error Resilience; Error Correcting Codes; FITs; Logic soft errors; Memory soft errors; Soft errors; architectural derating; availability; data integrity; error detection; logic derating; radiation hardening; recovery; reliability; timing derating;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
Conference_Location
Crete, Greece
Print_ISBN
0-7695-2918-6
Type
conf
DOI
10.1109/IOLTS.2007.61
Filename
4274812
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