• DocumentCode
    3083162
  • Title

    Soft Errors: Technology Trends, System Effects, and Protection Techniques

  • Author

    Mitra, Subhasish ; Sanda, Pia ; Seifert, Norbert

  • Author_Institution
    Stanford University
  • fYear
    2007
  • fDate
    8-11 July 2007
  • Firstpage
    4
  • Lastpage
    4
  • Abstract
    Radiation-induced soft errors are getting worse in digital systems manufactured in advanced technologies. Stringent data integrity and availability requirements of enterprise computing and networking applications demand special attention to soft errors in sequential elements and combinational logic. This tutorial will discuss the impact of technology scaling on soft error rates, circuit-level modeling of soft errors, architectural impact of soft errors, challenges associated with evaluation of run-time behaviors of systems in the presence of soft errors, actual data on system behaviors in the presence of soft errors, metrics for quantifying soft error vulnerabilities, design of architectures with Built-in-Soft-Error-Resilience techniques, and actual case studies.
  • Keywords
    Computer Society; Computer science education; Educational programs; Educational technology; Error correction codes; Josephson junctions; Logic testing; National electric code; Protection; Technical Councils; Built-In Soft Error Resilience; Error Correcting Codes; FITs; Logic soft errors; Memory soft errors; Soft errors; architectural derating; availability; data integrity; error detection; logic derating; radiation hardening; recovery; reliability; timing derating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
  • Conference_Location
    Crete, Greece
  • Print_ISBN
    0-7695-2918-6
  • Type

    conf

  • DOI
    10.1109/IOLTS.2007.61
  • Filename
    4274812