• DocumentCode
    3083583
  • Title

    The selection of optimal ICA algorithm parameters for robust AEP component estimates using 3 popular ICA algorithms

  • Author

    Castañeda-Villa, N. ; James, C.J.

  • Author_Institution
    Audiology Laboratory, at Universidad Autónoma Metropolitana-Izt, Mexico
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    5216
  • Lastpage
    5219
  • Abstract
    Many authors have used the Auditory Evoked Potential (AEP) recordings to evaluate the performance of their ICA algorithms and have demonstrated that this procedure can remove the typical EEG artifact in these recordings (i.e. blinking, muscle noise, line noise, etc.). However, there is little work in the literature about the optimal parameters, for each of those algorithms, for the estimation of the AEP components to reliably recover both the auditory response and the specific artifacts generated for the normal function of a Cochlear Implant (CI), used for the rehabilitation of deaf people. In this work we determine the optimal parameters of three ICA algorithms, each based on different independence criteria, and assess the resulting estimations of both the auditory response and CI artifact. We show that the algorithm utilizing temporal structure, such as TDSEP-ICA, is better in estimating the components of the auditory response, in recordings contaminated by CI artifacts, than higher order statistics based algorithms.
  • Keywords
    Algorithm design and analysis; Cochlear implants; Covariance matrix; Electroencephalography; Entropy; Higher order statistics; Independent component analysis; Muscles; Pollution measurement; Robustness; Algorithms; Child; Deafness; Diagnosis, Computer-Assisted; Electroencephalography; Evoked Potentials, Auditory; Female; Hearing Tests; Humans; Male; Principal Component Analysis; Reproducibility of Results; Sensitivity and Specificity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4650390
  • Filename
    4650390