• DocumentCode
    3083753
  • Title

    A successful distance-learning experience for IC test education

  • Author

    Bertrand, Yves ; Azaïs, Florence ; Flottes, Marie-Lise ; Lorival, Régis

  • Author_Institution
    LIRMM, Montpellier, France
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    20
  • Lastpage
    21
  • Abstract
    The paper describes an original educational experience that has been set by French universities to respond to IC manufacturer needs for electronics engineers having a double design and test competence. In each microelectronics academic center, students may be trained in the field of IC testing using real industrial up-to-date test resources. This is made possible by the concept of distributed remote access the authors have developed. In place of having some substandard test tools located in several university centers, it has been chosen to create a unique test center (the so-called CRTC) equipped with a high performing up-to-date ATE representative of real industrial test tools. The first working year of CRTC reveals a real demand in the field. About 30 trainings have been organized by CRTC during 1998. They have allowed about 150 people to be trained in characterization/production IC testing
  • Keywords
    automatic test equipment; distance learning; electronic engineering education; integrated circuit testing; integrated circuits; student experiments; test facilities; ATE; France; IC test education; characterization; distance learning experience; distributed remote access; educational experience; microelectronics academic centers; production; remote test facility; students; university; Design engineering; Educational institutions; Electronic equipment testing; Industrial training; Integrated circuit testing; Manufacturing industries; Microelectronics; Performance evaluation; Production; Pulp manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Systems Education, 1999. MSE'99. IEEE International Conference on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7695-0312-8
  • Type

    conf

  • DOI
    10.1109/MSE.1999.787017
  • Filename
    787017