Title :
VLSI design and test sequence in an academic environment: a case study
Author :
Nowakowski, Pawel ; Dziurla-Rucinska, Barbara ; Rucinski, Andrzej
Author_Institution :
Dept. of Electr. & Comput. Eng., New Hampshire Univ., Durham, NH, USA
Abstract :
Testing is an integral part of IC development process and its importance is steadily increasing. At the same time there exists a shortage of test engineers in the marketplace. The authors observe a considerable unbalance in the electrical engineering curricula between an abundance of courses offered in VLSI design/semiconductor materials and in testing. One of the root causes is due to the cost of the course related test equipment. This paper presents an educational experience implemented at the University of New Hampshire which incorporates both the design and testing aspects in VLSI which has been facilitated by the generous support and involvement of the regional industry. Additional byproducts of the course sequence are ambitious real life projects conducted by the students
Keywords :
VLSI; educational courses; electronic engineering education; integrated circuit design; integrated circuit testing; IC development process; IC testing; USA; VLSI design; academic environment; case study; courses; electrical engineering curricula; students; test equipment; test sequence; university; Computer aided software engineering; Testing; Very large scale integration;
Conference_Titel :
Microelectronic Systems Education, 1999. MSE'99. IEEE International Conference on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7695-0312-8
DOI :
10.1109/MSE.1999.787018