• DocumentCode
    3083771
  • Title

    Robustness of circuits under delay-induced faults : test of AES with the PAFI tool

  • Author

    Faurax, Olivier ; Tria, Assia ; Freund, Laurent ; Bancel, Frédéric

  • Author_Institution
    Ecole des Mines de St Etienne, Gardanne
  • fYear
    2007
  • fDate
    8-11 July 2007
  • Firstpage
    185
  • Lastpage
    186
  • Abstract
    Security of cryptographic circuits is a major concern. Fault attacks are a mean to obtain critical information with the use of physical disturbance and cryptanalysis. We propose a methodology and a tool to analyse the robustness of circuit under faults induced by a delay. We tested a circuit implementing AES and showed that delay faults can permit to perform known fault attacks.
  • Keywords
    cryptography; fault diagnosis; stability; AES; PAFI tool; circuit robustness; circuits under delay-induced faults; cryptanalysis; cryptographic circuits; differential fault analysis; fault attacks; prototype of another fault injector; Circuit faults; Circuit testing; Communication industry; Cryptography; Information security; Latches; Mining industry; Propagation delay; Prototypes; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
  • Conference_Location
    Crete
  • Print_ISBN
    0-7695-2918-6
  • Type

    conf

  • DOI
    10.1109/IOLTS.2007.57
  • Filename
    4274842
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3083771