• DocumentCode
    3085889
  • Title

    Detection at microwave frequencies based on self-adjoint sensitivity analysis

  • Author

    Liu, Li ; Trehan, Aastha ; Nikolova, Natalia K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    189
  • Lastpage
    192
  • Abstract
    A novel general formulation of the response sensitivity analysis is proposed and implemented in a computationally efficient algorithm for the detection of electrically small scatterers in a known background medium. The responses of the background medium where no scatterers are present are modeled via ultra-wideband time-domain simulation. Using these modeled responses and the measured responses of the examined object, 3D derivative maps are obtained within the object´s volume. The minima or maxima in these maps indicate the locations where the voxel permittivities and conductivities differ significantly between the measured and modeled media. Localization of the scatterers in a complex heterogeneous example is successfully conducted. The limitations of the detection algorithm and its resolution are studied using a homogeneous background example in terms of the number of transmission/reception points, the dielectric contrast and the size of the scatterer.
  • Keywords
    microwave imaging; sensitivity analysis; 3D derivative map; background medium; dielectric contrast; microwave imaging; scatterer localization; self adjoint sensitivity analysis; ultrawideband time domain simulation; Computational modeling; Conductivity measurement; Dielectric measurements; Microwave frequencies; Permittivity measurement; Scattering; Sensitivity analysis; Time domain analysis; Ultra wideband technology; Volume measurement; Detection; Jacobian maps; Localization; Microwave imaging; Sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5514767
  • Filename
    5514767