DocumentCode
30874
Title
Impact of Neutron-Induced Displacement Damage on the ATREE Response in LM124 Operational Amplifier
Author
Roig, Fabien ; Dusseau, L. ; Ribeiro, P. ; Auriel, G. ; Roche, Nicholas J.-H ; Privat, A. ; Vaille, J.-R. ; Boch, J. ; Saigne, F. ; Marec, R. ; Calvel, P. ; Bezerra, F. ; Ecoffet, R. ; Azais, Bruno
Author_Institution
Commissariat a l´Energie Atomique et aux Energies Alternatives, Gramat, France
Volume
61
Issue
6
fYear
2014
fDate
Dec. 2014
Firstpage
3043
Lastpage
3049
Abstract
The synergistic effect between displacement damage dose (DDD) and analog transient radiation effects on electronics (ATREE) in an operational amplifier (LM124) (opamp) from three different manufacturers is investigated. Pulsed X-ray experiments have highlighted ATREE sensitivity on devices significantly more important following exposure to fission neutrons than for unirradiated devices. A previously developed simulation tool is used to model ATREE responses taking into account the electrical parameters degradation due to displacement damage phenomenon. A good agreement is observed between model outputs and experimental ATREE results.
Keywords
neutron effects; operational amplifiers; radiation hardening (electronics); ATREE response; DDD; LM124 operational amplifier; analog transient radiation effects on electronics; displacement damage dose; electrical parameter degradation; fission neutrons; neutron-induced displacement damage phenomenon; opamp; pulsed X-ray experiments; synergistic effect; unirradiated devices; Degradation; Electric variables measurement; Integrated circuit modeling; Operational amplifiers; Performance evaluation; Radiation effects; Single event transients; Transient response; Bipolar analog integrated circuits; X-ray effects; circuit modeling; displacement damage; total non-ionizing dose; transient radiation effects; transient response;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2014.2365048
Filename
6949159
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