• DocumentCode
    30874
  • Title

    Impact of Neutron-Induced Displacement Damage on the ATREE Response in LM124 Operational Amplifier

  • Author

    Roig, Fabien ; Dusseau, L. ; Ribeiro, P. ; Auriel, G. ; Roche, Nicholas J.-H ; Privat, A. ; Vaille, J.-R. ; Boch, J. ; Saigne, F. ; Marec, R. ; Calvel, P. ; Bezerra, F. ; Ecoffet, R. ; Azais, Bruno

  • Author_Institution
    Commissariat a l´Energie Atomique et aux Energies Alternatives, Gramat, France
  • Volume
    61
  • Issue
    6
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    3043
  • Lastpage
    3049
  • Abstract
    The synergistic effect between displacement damage dose (DDD) and analog transient radiation effects on electronics (ATREE) in an operational amplifier (LM124) (opamp) from three different manufacturers is investigated. Pulsed X-ray experiments have highlighted ATREE sensitivity on devices significantly more important following exposure to fission neutrons than for unirradiated devices. A previously developed simulation tool is used to model ATREE responses taking into account the electrical parameters degradation due to displacement damage phenomenon. A good agreement is observed between model outputs and experimental ATREE results.
  • Keywords
    neutron effects; operational amplifiers; radiation hardening (electronics); ATREE response; DDD; LM124 operational amplifier; analog transient radiation effects on electronics; displacement damage dose; electrical parameter degradation; fission neutrons; neutron-induced displacement damage phenomenon; opamp; pulsed X-ray experiments; synergistic effect; unirradiated devices; Degradation; Electric variables measurement; Integrated circuit modeling; Operational amplifiers; Performance evaluation; Radiation effects; Single event transients; Transient response; Bipolar analog integrated circuits; X-ray effects; circuit modeling; displacement damage; total non-ionizing dose; transient radiation effects; transient response;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2365048
  • Filename
    6949159