DocumentCode :
3087668
Title :
The research of Risk assessment & Sampling methodology combination
Author :
Zhang, Nicholas ; Chou, Chad ; Guo, Sherry ; Ma, Jenny ; Kang, Randy
Author_Institution :
Quality & Reliability, Semicond. Manufactory Int. Corp., Tianjin, China
fYear :
2015
fDate :
15-16 March 2015
Firstpage :
1
Lastpage :
3
Abstract :
In ISO/TS16949 international standard, process audit is a mandatory system requirement, to confirm the effectiveness of the manufacturing process. But the standard doesn´t clearly indicate the specific sampling size. The sampling quantity is often judged by personal experience during the audit, which may lead to discrepancy when choosing the sampling size, which further leading to audit result difference. The outcomes of the research of the Risk assessment & Sampling methodology combination are to provide a kind of method, as a unified, the determination of specific audit sampling size of guide, to eliminate the differences between sampling by personal experience judgment, so as to ensure high consistency of audit results.
Keywords :
ISO standards; auditing; manufacturing processes; risk management; ISO-TS16949 international standard; audit sampling size; mandatory system requirement; manufacturing process; personal experience judgment; process audit; risk assessment; sampling methodology combination; Inspection; Lead; Manufacturing processes; Process control; Risk management; Standards organizations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Technology International Conference (CSTIC), 2015 China
Conference_Location :
Shanghai
ISSN :
2158-2297
Type :
conf
DOI :
10.1109/CSTIC.2015.7153461
Filename :
7153461
Link To Document :
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