DocumentCode
3089441
Title
Industry-academia collaboration in undergraduate test engineering unit development
Author
Demidenko, Serge ; Lai, Victor ; Kassim, Zainal Abu
Author_Institution
Sch. of Eng., Monash Univ. Malaysia, Petaling Jaya, Malaysia
fYear
2006
fDate
17-19 Jan. 2006
Abstract
There is a permanent shortage of qualified test engineers in the electronic industry and R&D organizations, thus leading to a high demand for such staff. Addressing the issue, leading electronic companies have started to cooperate closely with universities in the area of training future test and failure analysis engineering specialists. Malaysia is a home of large semiconductor fabrication facilities representing a number of major multinational corporations. Freescale Semiconductor Malaysia is among the largest IC fabrication companies in the country. Responding to the needs of the semiconductor sector, Monash University Malaysia and Freescale Semiconductor have jointly developed and implemented an undergraduate unit (subject) on Electronic Test Technology. The unit is available to the 4th year students of BE degrees in Electrical and Computer Systems Engineering and Mechatronics. The successful collaboration between the university and company covers also a number of other areas such as industrial attachments and final year (graduate) project development at Freescale Semiconductor with joint company-university supervision, joint postgraduate supervision, participation in industry-academia advisory committees, joint research publications and presentations, organising seminars and conferences, etc.
Keywords
electrical engineering education; international collaboration; research and development management; Electronic Test Technology subject; Freescale Semiconductor; Malaysia; Monash University; R and D organizations; electronic industry; failure analysis engineering specialists.; industry-academia collaboration; multinational corporations; postgraduate supervision; qualified test engineers; semiconductor fabrication facilities; training future test; undergraduate test engineering; unit development; Collaboration; Educational institutions; Electronic equipment testing; Electronics industry; Fabrication; Failure analysis; Industrial training; Research and development; Semiconductor device testing; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2006. DELTA 2006. Third IEEE International Workshop on
Print_ISBN
0-7695-2500-8
Type
conf
DOI
10.1109/DELTA.2006.58
Filename
1581199
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