DocumentCode :
3090469
Title :
Speech Recognition of Isolated Malayalam Words Using Wavelet Features and Artificial Neural Network
Author :
Krishnan, V.R.V. ; Jayakumar, Athulya ; Anto, P.B.
Author_Institution :
Kannur Univ., Kannur
fYear :
2008
fDate :
23-25 Jan. 2008
Firstpage :
240
Lastpage :
243
Abstract :
This paper deals a novel speech feature extraction technique based on wavelet. We have employed daubechies 4 type of wavelet for feature extraction. Artificial neural network technique (ANN) is used for classification and recognition purpose. We have used five Malayalam (one of the South Indian languages) words for the experiment. One hundred and sixty samples are collected, categorized labeled and stored in a database. The feature vector is produced for all words and formed a training set for classification and recognition purpose. A sequence of decomposition levels are carried out to achieve a good feature vector. A feature vector of element size twelve is collected for all words at the eighth level of decomposition. A graph is also prepared for the comparison of the signal at each decomposition level. From that graph we can understand the physical changes that are occurred during the decomposition. By using this method we have achieved a recognition rate of 89%.
Keywords :
feature extraction; graph theory; learning (artificial intelligence); natural language processing; neural nets; signal classification; speech recognition; wavelet transforms; Malayalam words; artificial neural network; daubechies 4 type wavelet; decomposition level; feature extraction; graph theory; speech classification; speech recognition; training set; Artificial neural networks; Automatic speech recognition; Discrete wavelet transforms; Electronic equipment testing; Feature extraction; Frequency; Information science; Isolation technology; Spatial databases; Speech recognition; artificial nueral network; classifier; daubechies; decomposition; discrete wavelet;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-0-7695-3110-6
Type :
conf
DOI :
10.1109/DELTA.2008.88
Filename :
4459548
Link To Document :
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