Title :
Dependence Of Barkhausen Noise On Material Parameters In Shielded Mr Heads
Author :
Ramesh, M. ; Dee, R.H. ; Franzel, K.
Author_Institution :
Storage Technology Corporation, Louisville, CO 80028-8110, USA
Keywords :
Anisotropic magnetoresistance; Fabrication; Geometry; Histograms; Magnetic films; Magnetic flux; Magnetic heads; Magnetic noise; Magnetostriction; Noise measurement;
Conference_Titel :
Magnetics Conference, 1993. INTERMAG '93., Digest of International
Conference_Location :
Stockhom, Sweden
Print_ISBN :
0-7803-1310-0
DOI :
10.1109/INTMAG.1993.642139