DocumentCode :
3091045
Title :
Emulation-based design errors identification
Author :
Castelnuovo, A. ; Fin, A. ; Fummi, F. ; Sforza, F.
Author_Institution :
Dynamic Verification Group, STMicroelectronics, Milano, Italy
fYear :
2002
fDate :
2002
Firstpage :
365
Lastpage :
371
Abstract :
Design verification has a large impact on the final testability of a system. The identification and removal of design errors from the initial design steps increases the testing quality of the entire design flow. We propose in this paper to exploit the potentialities of an emulator to accelerate a validation methodology for RTL designs. Alternative emulator configurations are compared in order to evaluate the performance speed-up of the presented methodology. The RTL design functionalities are compared with a System C executable specification model.
Keywords :
automatic test pattern generation; design for testability; formal verification; high level synthesis; logic testing; RTL designs; System C executable specification model; design errors identification; emulation-based design errors; final testability; initial design steps; performance speed-up; testing quality; validation methodology; Acceleration; Algorithm design and analysis; Automatic test pattern generation; Automatic testing; Computer errors; Design methodology; Design optimization; Life estimation; Research and development; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. 17th IEEE International Symposium on
ISSN :
1550-5774
Print_ISBN :
0-7695-1831-1
Type :
conf
DOI :
10.1109/DFTVS.2002.1173533
Filename :
1173533
Link To Document :
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