DocumentCode :
3091052
Title :
Eigenspectra Palmprint Recognition
Author :
Laadjel, Moussadek ; Bouridane, Ahmed ; Kurugollu, Fatih
Author_Institution :
Queens Univ. Belfast, Belfast
fYear :
2008
fDate :
23-25 Jan. 2008
Firstpage :
382
Lastpage :
385
Abstract :
This paper proposes a novel technique for palmprint recognition in the transform domain and based on a combination of Principal Component Analysis (PCA) and Fourier transform. Although, PCA is widely adopted as one of the most promising tools for use in biometric recognition systems, it comes with its own limitations: poor discriminating power in the presence of variant illuminations, requires a large computational load when the original dimensionality of data is high while the number of training samples is usually large. Traditionally, to represent the palmprint image, PCA is carried out on the whole spatial image. In the proposed method, Fourier transform is used to decompose an image into its sine and cosine components, then the spectrum is used for PCA representation since doing PCA on the whole frequency domain does not achieve any performance improvements. In comparison with the traditional PCA and three other methods, the proposed method yields better recognition accuracy and discriminating. In addition, the proposed method reduces the computational load significantly to half due to the symmetry property of Fourier transform.
Keywords :
Fourier transforms; biometrics (access control); image recognition; principal component analysis; Fourier transform; PCA; biometric recognition systems; eigenspectra palmprint recognition; principal component analysis; Application software; Biometrics; Computer science; Covariance matrix; Data mining; Electronic equipment testing; Feature extraction; Fourier transforms; Frequency domain analysis; Principal component analysis; Fourier transform; PCA; Palmprint recognition; normalized cross correlation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-0-7695-3110-6
Type :
conf
DOI :
10.1109/DELTA.2008.62
Filename :
4459576
Link To Document :
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