Title :
Applications of integrated circuits to AGC, squelch, and priority interrupt control functions in microelectronics transceivers
Author_Institution :
Westinghouse Defense and Space Center, Baltimore, Maryland
Keywords :
Application specific integrated circuits; Integrated circuit noise; Integrated circuit reliability; Laboratories; Microelectronics; Monolithic integrated circuits; Prototypes; Transceivers; Volume measurement;
Conference_Titel :
Adaptive Processes, Sixth Symposium on
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/SAP.1967.272988