DocumentCode
3093167
Title
A Unified Method Based on Wavelet Transform and C-V Model for Crack Segmentation of 3D Industrial CT Images
Author
Liu, Linghui ; Zeng, Li ; Bi, Bi
Author_Institution
ICT Res. Center, Chongqing Univ., Chongqing, China
fYear
2011
fDate
12-15 Aug. 2011
Firstpage
12
Lastpage
16
Abstract
Accurate segmentation of cracked body from three-dimensional (3D) industrial Computed Tomography (CT) images is an important step in the process of crack measurement and automatic recognition. In this paper we present a fast method for the segmentation of cracked body. The improved algorithm incorporates wavelet transform and Chan and Vese (C-V) model as key components. The 3D wavelet transform is applied for detecting rough edges. Then region growing is used to find a suitable region which contains cracked body. Based on the resulting volume data, 3D C-V model is used to capture the edges of cracked body. The improved method can locate rough regions by using wavelet modulus maxima, which not only reduces the amount of data C-V model processed, but also provides initial contour surface that can accelerate the convergence speed of C-V model. Experimental results illustrate our method can accurately detect the cracked surface, as well as give computational savings of segmentation which satisfy the demand of defects detection of industrial CT.
Keywords
computerised tomography; crack detection; edge detection; image segmentation; production engineering computing; wavelet transforms; 3D C-V model; 3D industrial CT images; 3D wavelet transform; Chan and Vese model; automatic recognition; crack measurement; crack segmentation; three-dimensional industrial computed tomography images; wavelet modulus maxima; Capacitance-voltage characteristics; Computed tomography; Image edge detection; Image segmentation; Three dimensional displays; Wavelet transforms; 3D Industrial CT Images; C-V Model; Wavelet Transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Graphics (ICIG), 2011 Sixth International Conference on
Conference_Location
Hefei, Anhui
Print_ISBN
978-1-4577-1560-0
Electronic_ISBN
978-0-7695-4541-7
Type
conf
DOI
10.1109/ICIG.2011.25
Filename
6005546
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