Title :
Coverage based test-case generation using model checkers
Author :
Rayadurgam, Sanjai ; Heimdahl, Mats P E
Author_Institution :
Dept. of Comput. Sci. & Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
Presents a method for automatically generating test cases according to structural coverage criteria. We show how a model checker can be used to automatically generate complete test sequences that provide a pre-defined coverage of any software development artifact that can be represented as a finite state model. Our goal is to help reduce the high cost of developing test cases for safety-critical software applications that require a certain level of coverage for certification, e.g. safety-critical avionics systems that need to demonstrate MC/DC (modified condition and decision) coverage of the code. We define a formal framework which is suitable for modeling software artifacts like requirements models, software specifications or implementations. We then show how various structural coverage criteria can be formalized and used to make a model checker provide test sequences to achieve this coverage. To illustrate our approach, we demonstrate how a model checker can be used to generate test sequences for MC/DC coverage of a small case example.
Keywords :
automatic test pattern generation; certification; formal verification; program testing; safety-critical software; sequences; MC/DC coverage; automatic test sequence generation; avionics systems; certification; coverage-based test-case generation; finite state model; model checkers; modified condition and decision coverage; requirements models; safety-critical software applications; software development artifacts; software implementations; software specifications; structural coverage criteria; Aerospace electronics; Application software; Automatic testing; Certification; Costs; DC generators; Programming; Software safety; Software testing; System testing;
Conference_Titel :
Engineering of Computer Based Systems, 2001. ECBS 2001. Proceedings. Eighth Annual IEEE International Conference and Workshop on the
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7695-1086-8
DOI :
10.1109/ECBS.2001.922409