DocumentCode :
3093739
Title :
Application of Sun Protection Factor and Ultra Violet in Alarming Hat
Author :
Lin, Yi-Sian ; Wang, Hsien-Yu ; Lee, Chang-Chi ; Shieh, Jen-Yu
Author_Institution :
Nat. Taipei Univ. of Technol., Taipei
fYear :
2007
fDate :
5-8 Nov. 2007
Firstpage :
2141
Lastpage :
2145
Abstract :
In this article we presented an application of sun protection factor (SPF) and ultra violet in alarming hat. In summer time most of women care about skin with the sun light condition. In order to acknowledge the sun burn extent under ultra violet (UV), a device was designed to inform people by using the MEDs, Minimal erythema dose, with different kind of race skin and different cosmetic lotion of SPF value used. However, when people with different skin type used different lotion of SPF value, the beginning total energy which could resist the ultra violet was the initial value. The harmful UV energy is accumulated under the real time UV index. As the harmful energy or UV index increase, the total energy will decrease gradually down to zero. Therefore, this alarming hat will remind people when the danger situation or energy is down to zero. By using UV spectral irradiance and erythema action spectrum, real time UV energy can be obtained. In addition, a photo sensor and amplified circuit is implemented to integrate in this system.
Keywords :
biological effects of ultraviolet radiation; biomedical electronics; biomedical equipment; biomedical measurement; dosimetry; optical sensors; radiation protection; skin; sunlight; alarming hat; amplified circuit; cosmetic lotion; erythema action spectrum; harmful UV energy accumulation; minimal erythema dose; photosensor; race skin conditions; real time UV index; skin; sun burns; sun protection factor; sunlight condition; ultraviolet spectral irradiation; Antarctica; Equations; Humans; Industrial Electronics Society; Lamps; Protection; Skin; Sun; Ultra wideband technology; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, 2007. IECON 2007. 33rd Annual Conference of the IEEE
Conference_Location :
Taipei
ISSN :
1553-572X
Print_ISBN :
1-4244-0783-4
Type :
conf
DOI :
10.1109/IECON.2007.4459902
Filename :
4459902
Link To Document :
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