DocumentCode :
3093955
Title :
Statistical decoupling capacitance allocation by efficient numerical quadrature method
Author :
Eguia, Thom Jefferson A ; Mi, Ning ; Tan, Sheldon X D
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Riverside, CA
fYear :
2009
fDate :
16-18 March 2009
Firstpage :
309
Lastpage :
316
Abstract :
In this paper, we propose a novel statistical decap allocation method to reduce the voltage drop noise in the presence of variational leakage current sources. The new method can derive the closed form of decoupling capacitance (decaps) in terms of variational parameters from the variational leakage currents. It treats the deterministic decap method as a black box and can work with any existing simulation-based methods. The new method employs the orthogonal polynomials to represent the variational gate leakages in a closed form first. Decap distributions are then computed by a fast multi-dimentional Gaussian quadrature method with sparse grid technique. Experimental results show that the proposed method can deliver order of magnitudes speedup over the Monte Carlo method with almost the same accurancy.
Keywords :
leakage currents; microprocessor chips; polynomials; statistical analysis; deterministic decap method; fast multi-dimentional Gaussian quadrature method; numerical quadrature method; sparse grid technique; statistical decap allocation method; statistical decoupling capacitance allocation; variational leakage current sources; Capacitance; Distributed computing; Gate leakage; Grid computing; Leakage current; Noise reduction; Polynomials; Random variables; Threshold voltage; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
Type :
conf
DOI :
10.1109/ISQED.2009.4810313
Filename :
4810313
Link To Document :
بازگشت