DocumentCode :
3094038
Title :
Understanding the effect of uncorrelated phase noise on the phase coherency of multi-channel RF vector signal analyzers
Author :
Hall, Drew A. ; Hinde, Andy
Author_Institution :
National Instruments, Austin, United States
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1
Lastpage :
1
Abstract :
While MIMO test setups traditionally used multiple VSA´s with a shared 10 MHz reference clock, new modular RF instruments allow for a single LO to be shared between each channel of a multi-channel VSA. For both architectures, key contributors to channel-to-channel phase uncertainty are uncorrelated phase noise and ADC quantization noise. As the results from these experiments demonstrate, uncorrelated phase noise dominates channel-to-channel phase offsets in multi-channel VSA´s which use independent LO´s for each downconverter. By contrast, ADC quantization noise dominates channel-to-channel phase uncertainty in multi-channel VSA´s using a common synthesized LO for each channel. Moreover, the absolute channel-to-channel phase uncertainty is significantly better in the multi-channel VSA which uses a common LO for each downconverter chain.
Keywords :
Clocks; Instruments; MIMO; Phase noise; Quantization; RF signals; Radio frequency; Signal analysis; Testing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5515152
Filename :
5515152
Link To Document :
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