• DocumentCode
    3095151
  • Title

    A 0.56-V 128kb 10T SRAM using column line assist (CLA) scheme

  • Author

    Okumura, Shunsuke ; Iguchi, Yusuke ; Yoshimoto, Shusuke ; Fujiwara, Hidehiro ; Noguchi, Hiroki ; Nii, Koji ; Kawaguchi, Hiroshi ; Yoshimoto, Masahiko

  • Author_Institution
    Kobe Univ., Kobe
  • fYear
    2009
  • fDate
    16-18 March 2009
  • Firstpage
    659
  • Lastpage
    663
  • Abstract
    We present a small-area 10T SRAM cell without half selection problem. As well, the proposed 10T cell achieves a faster access time and low voltage operation. The cell area is reduced by 25%, and the cell current is increased by 21%, compared with the prior 10T cell. The minimum operating voltage is lowered by the column line assist (CLA) scheme that suppresses write margin degradation. By measurement, we confirmed that the proposed 128-kb SRAM works at 0.56 V.
  • Keywords
    SRAM chips; low-power electronics; SRAM cell; column line assist scheme; half selection problem; storage capacity 128 Kbit; voltage 0.56 V; write margin degradation; Degradation; Integrated circuit interconnections; Logic; Low voltage; MOSFETs; Random access memory; Read-write memory; Threshold voltage; SRAM; low-voltage operation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2952-3
  • Electronic_ISBN
    978-1-4244-2953-0
  • Type

    conf

  • DOI
    10.1109/ISQED.2009.4810372
  • Filename
    4810372