• DocumentCode
    3095604
  • Title

    Uncriticality-directed scheduling for tackling variation and power challenges

  • Author

    Sato, Toshinori ; Watanabe, Shingo

  • Author_Institution
    Fukuoka Univ., Fukuoka
  • fYear
    2009
  • fDate
    16-18 March 2009
  • Firstpage
    820
  • Lastpage
    825
  • Abstract
    The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability. Increasing the supply voltage to reduce the delay should not be a solution, since it increases power consumption, which is another serious problem in microprocessor designs. This paper proposes to combine recently-proposed configurable latency technique with an instruction scheduling technique considering instruction uncriticality. While relying only on the configurable latency technique degrades processor performance, the combination maintains it by executing only uncritical instructions in the long-latency units. The uncriticality-directed technique is extended for power reduction. This can be achieved by decreasing supply voltage for some variation-unaffected units. Detailed simulations show that the proposed scheduling technique improves processor performance by 7.0% on average over the conventional scheduling and that performance degradation from a variation-free processor is only 2.3% on average, when 2 of 4 integer ALUs are affected by variations. It also improves energy efficiency by 9.9% on average.
  • Keywords
    low-power electronics; microprocessor chips; processor scheduling; configurable latency technique; energy efficiency; microprocessor; performance degradation; power reduction; uncriticality-directed scheduling; variation-free processor; Circuits; Degradation; Delay; Energy consumption; Frequency; Microprocessors; Processor scheduling; Temperature; Threshold voltage; Transistors; Variability resilience; low power; microarchitecture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2952-3
  • Electronic_ISBN
    978-1-4244-2953-0
  • Type

    conf

  • DOI
    10.1109/ISQED.2009.4810398
  • Filename
    4810398