DocumentCode
3095604
Title
Uncriticality-directed scheduling for tackling variation and power challenges
Author
Sato, Toshinori ; Watanabe, Shingo
Author_Institution
Fukuoka Univ., Fukuoka
fYear
2009
fDate
16-18 March 2009
Firstpage
820
Lastpage
825
Abstract
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability. Increasing the supply voltage to reduce the delay should not be a solution, since it increases power consumption, which is another serious problem in microprocessor designs. This paper proposes to combine recently-proposed configurable latency technique with an instruction scheduling technique considering instruction uncriticality. While relying only on the configurable latency technique degrades processor performance, the combination maintains it by executing only uncritical instructions in the long-latency units. The uncriticality-directed technique is extended for power reduction. This can be achieved by decreasing supply voltage for some variation-unaffected units. Detailed simulations show that the proposed scheduling technique improves processor performance by 7.0% on average over the conventional scheduling and that performance degradation from a variation-free processor is only 2.3% on average, when 2 of 4 integer ALUs are affected by variations. It also improves energy efficiency by 9.9% on average.
Keywords
low-power electronics; microprocessor chips; processor scheduling; configurable latency technique; energy efficiency; microprocessor; performance degradation; power reduction; uncriticality-directed scheduling; variation-free processor; Circuits; Degradation; Delay; Energy consumption; Frequency; Microprocessors; Processor scheduling; Temperature; Threshold voltage; Transistors; Variability resilience; low power; microarchitecture;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-2952-3
Electronic_ISBN
978-1-4244-2953-0
Type
conf
DOI
10.1109/ISQED.2009.4810398
Filename
4810398
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