DocumentCode :
3095604
Title :
Uncriticality-directed scheduling for tackling variation and power challenges
Author :
Sato, Toshinori ; Watanabe, Shingo
Author_Institution :
Fukuoka Univ., Fukuoka
fYear :
2009
fDate :
16-18 March 2009
Firstpage :
820
Lastpage :
825
Abstract :
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability. Increasing the supply voltage to reduce the delay should not be a solution, since it increases power consumption, which is another serious problem in microprocessor designs. This paper proposes to combine recently-proposed configurable latency technique with an instruction scheduling technique considering instruction uncriticality. While relying only on the configurable latency technique degrades processor performance, the combination maintains it by executing only uncritical instructions in the long-latency units. The uncriticality-directed technique is extended for power reduction. This can be achieved by decreasing supply voltage for some variation-unaffected units. Detailed simulations show that the proposed scheduling technique improves processor performance by 7.0% on average over the conventional scheduling and that performance degradation from a variation-free processor is only 2.3% on average, when 2 of 4 integer ALUs are affected by variations. It also improves energy efficiency by 9.9% on average.
Keywords :
low-power electronics; microprocessor chips; processor scheduling; configurable latency technique; energy efficiency; microprocessor; performance degradation; power reduction; uncriticality-directed scheduling; variation-free processor; Circuits; Degradation; Delay; Energy consumption; Frequency; Microprocessors; Processor scheduling; Temperature; Threshold voltage; Transistors; Variability resilience; low power; microarchitecture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
Type :
conf
DOI :
10.1109/ISQED.2009.4810398
Filename :
4810398
Link To Document :
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