A current conveyor based BIC sensor for current monitoring in mixed-signal circuits

Author

Siskos, S. ; Laopoulos, Th ; Hatzopoulos, A.A. ; Bafleur, M.

Author_Institution

Aristotelian Univ. of Thessaloniki, Greece

Volume

2

fYear

1996

fDate

13-16 Oct 1996

Firstpage

1210

Abstract

Quiescent current monitoring is considered as an interesting and efficient technique for mixed-signal testing, where fault detection of analog parts requires the precise measure of the I_ddq. This paper presents a very simple current sensor for on-chip current monitoring giving an accurate analog output proportional to the quiescent current. The proposed circuit is based on a second generation current conveyor. Experimental results show the functionality of the proposed configuration and its linear output characteristic

Keywords

current conveyors; electric current measurement; electric sensing devices; integrated circuit testing; mixed analogue-digital integrated circuits; IDDQ measurement; built-in current sensor; fault detection; mixed-signal circuit testing; on-chip quiescent current monitoring; second generation current conveyor; CMOS technology; Circuit faults; Circuit testing; Computerized monitoring; Condition monitoring; Current supplies; Electrical fault detection; Electronic equipment testing; Fault detection; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on

Conference_Location

Rodos

Print_ISBN

0-7803-3650-X

Type

conf

DOI

10.1109/ICECS.1996.584646

Filename

584646