DocumentCode :
3098130
Title :
A Facial-Skin Condition Classification System in Wavelet Domain
Author :
Lee, Jiann-Der ; Chen, Yu-Chi ; Liu, Li-Chang ; Huang, Chung-Hsien
Author_Institution :
Chang Gung Univ., Tao-Yuan
fYear :
2007
fDate :
5-8 Nov. 2007
Firstpage :
2419
Lastpage :
2422
Abstract :
This paper describes a facial-skin condition evaluation system based on cosmetician´s suggestions to let the users realize their facial-skin conditions. Two kinds of features are extracted from the captured skin image. Four parameters of sub-band information of the gray part of a color skin image in wavelet domain are used as the first kind of features. The contrast, inverse difference moment, deviation information in the gray-value histogram, and the entropy of the co-occurrence matrix information are calculated as the second kind of features. The fuzzy rule extraction on the first-kind features is sued to distinguish the oily skin group from the others. The fuzzy c-means process with the second-kind features is used to classify the neutral skin and the dry skin. In the experiments, the classified results are compared with the cosmeticians´ results, and the correct rates are 100% for the first test group of 30 test images and 92.8% for the second test group of 14 images.
Keywords :
feature extraction; fuzzy set theory; image classification; image colour analysis; matrix algebra; skin; wavelet transforms; co-occurrence matrix information; color skin image; dry skin; facial-skin condition classification system; facial-skin condition evaluation system; feature extraction; fuzzy c-means process; fuzzy rule extraction; gray-value histogram; inverse difference moment; neutral skin; sub-band information; wavelet domain; Data mining; Embedded system; Entropy; Feature extraction; Filters; Histograms; Lubricating oils; Skin; Testing; Wavelet domain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, 2007. IECON 2007. 33rd Annual Conference of the IEEE
Conference_Location :
Taipei
ISSN :
1553-572X
Print_ISBN :
1-4244-0783-4
Type :
conf
DOI :
10.1109/IECON.2007.4460152
Filename :
4460152
Link To Document :
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