Title :
Class-A stacked SiGe HBT power amplifier at millimeter-wave
Author :
Farmer, Thomas J. ; Darwish, Ali ; Huebschman, Benjamin ; Viveiros, Edward ; Hung, H. Alfred ; Zaghloul, Mona E.
Author_Institution :
RF & Electron. Div./SEDD, U.S. Army Res. Lab., Adelphi, MD, USA
Abstract :
The advancement of silicon-based transistor´s fT and fMAX have ushered in a new contender in the area of millimeter-wave integrated circuit technology [1], [2]. Silicon´s greatest advantage over III-V based technologies, to integrate both digital and RF functions onto a single chip, has been demonstrated successfully across the millimeter-wave spectrum [3]-[5]. However, one of silicon´s greatest weaknesses, low breakdown voltages, prevents the implementation of a quality power amplifier at millimeter-wave frequencies [6]. This paper discusses a millimeter-wave power amplifier implemented using a stacked transistor architecture known as the High Voltage / High Power (HiVP) configuration [7]. Using this configuration, a silicon-based amplifier achieving an output power of 19 dBm with 11.47% PAE in 0.23 mm2 of area, has been created using a commercial 120 nm SiGe HBT BiCMOS process. Unique to this implementation, this class-A amplifier achieves a 50 Ω match at 30 GHz while offering a new amplifier architecture ready for single chip integration [8], [9].
Keywords :
BiCMOS analogue integrated circuits; Ge-Si alloys; bipolar MIMIC; elemental semiconductors; field effect MIMIC; heterojunction bipolar transistors; millimetre wave power amplifiers; silicon; HBT BiCMOS process; HiVP configuration; III-V based technologies; RF function; SiGe; breakdown voltages; class-A stacked silicon germanium HBT power amplifier; digital function; frequency 30 GHz; high-voltage-high-power configuration; millimeter-wave frequencies; millimeter-wave integrated circuit technology; millimeter-wave power amplifier; millimeter-wave spectrum; quality power amplifier; silicon-based transistor; single-chip integration; stacked transistor architecture; Heterojunction bipolar transistors; Load modeling; Millimeter wave transistors; Power amplifiers; Radio frequency; Silicon germanium;
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
DOI :
10.1109/ISDRS.2011.6135274