DocumentCode :
3102271
Title :
Variable-step 12-bit ADC based on counter ramp recycling architecture suitable for CMOS imagers with column-parallel readout
Author :
Hassan, Tarek M. ; Strobel, M. ; Richter, H. ; Burghartz, Joachim N.
Author_Institution :
Inst. for Microelectron. Stuttgart (IMS CHIPS), Stuttgart, Germany
fYear :
2013
fDate :
24-27 June 2013
Firstpage :
41
Lastpage :
44
Abstract :
A 12-bit counter ramp recycling analog-to-digital converter (ADC) is proposed, which can be configured in a single-step mode for achieving high conversion accuracy as well as in various multi-step modes for yielding high conversion speed. A unique ADC circuit realization is used for the different modes of operation, while a digital control unit is responsible for providing the necessary control signals to the ADC. Similar to common counter ramp architectures, the proposed implementation is suitable for column-parallel readout owing to its simplicity. The proposed variable-step recycling ADC is implemented in a 0.18μm CMOS technology from UMC. Simulation results show good agreement with the expected trade-off between speed and accuracy, which is common to all conventional ADCs.
Keywords :
CMOS image sensors; analogue-digital conversion; CMOS imagers; UMC; analog-to-digital converter; column-parallel readout; control signals; counter ramp recycling architecture; digital control unit; multistep modes; single-step mode; size 0.18 mum; variable-step ADC; word length 12 bit; Accuracy; CMOS integrated circuits; Clocks; Generators; Radiation detectors; Recycling; Switches; algorithmic; analog-to-digital converters; column-parallel; counter ramp; multi-step;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ph.D. Research in Microelectronics and Electronics (PRIME), 2013 9th Conference on
Conference_Location :
Villach
Print_ISBN :
978-1-4673-4580-4
Type :
conf
DOI :
10.1109/PRIME.2013.6603107
Filename :
6603107
Link To Document :
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