Title :
NFA-Based Pattern Matching for Deep Packet Inspection
Author :
Sun, Yan ; Valgenti, Victor C. ; Kim, Min Sik
Author_Institution :
Sch. of Electr. & Comput. Eng., Washington State Univ., Pullman, WA, USA
fDate :
July 31 2011-Aug. 4 2011
Abstract :
Many network security applications in today´s networks are based on deep packet inspection, checking not only the header portion but also the payload portion of a packet. For example, traffic monitoring, layer-7 filtering, and network intrusion detection all require an accurate analysis of packet content in search for predefined patterns to identify specific classes of applications, viruses, attack signatures, etc. Pattern matching is a major task in deep packet inspection. The two most common implementations of Pattern matching are based on Non-deterministic Finite Automata (NFAs) and Deterministic Finite Automata (DFAs), which take the payload of a packet as an input string. In this paper, we propose an efficient NFA-based pattern matching in Binary Content Addressable Memory(BCAM), which uses data search words consisting of 1s and 0s. Our approach can process multiple characters at a time using limited BCAM entries, which makes our approach scalable well. We evaluate our algorithm using patterns provided by Snort, a popular open-source intrusion detection system. The simulation results show that our approach outperforms existing CAM-based and software-based approaches.
Keywords :
computer network security; content-addressable storage; deterministic automata; finite automata; pattern matching; BCAM; NFA-based pattern matching; Snort; binary content addressable memory; data search word; deep packet inspection; network security; nondeterministic finite automata; open-source intrusion detection system; Automata; Clocks; Computer aided manufacturing; Computer architecture; Doped fiber amplifiers; Microprocessors; Pattern matching;
Conference_Titel :
Computer Communications and Networks (ICCCN), 2011 Proceedings of 20th International Conference on
Conference_Location :
Maui, HI
Print_ISBN :
978-1-4577-0637-0
DOI :
10.1109/ICCCN.2011.6006095