Title :
Experimental test of a charge conserving macromodel for MOSFETs
Author :
Kim, Joon-Yub ; Geiger, Randall L.
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
A charge conserving macromodel convenient to use and effective for the simulation of the charge injection behavior of MOSFET switches has been presented. The macromodel is compared with the SPICE level 2 charge conserving model. The accuracy of the macromodel is tested by measuring the clock-feed-through error of a simple sample-and-hold circuit. The macromodel is accurate even at high switching speed because of its distributed nature and because of its ability to simulate the leakage current to the bulk
Keywords :
MOSFET; field effect transistor switches; leakage currents; sample and hold circuits; semiconductor device models; MOSFET switches; charge conserving macromodel; charge injection behavior; clock-feed-through error; leakage current; sample-and-hold circuit; switching speed; Capacitance; Circuit simulation; Circuit testing; Clocks; Instruments; MOSFETs; SPICE; Switches; Switching circuits; Voltage;
Conference_Titel :
Circuits and Systems, 1996., IEEE 39th Midwest symposium on
Conference_Location :
Ames, IA
Print_ISBN :
0-7803-3636-4
DOI :
10.1109/MWSCAS.1996.594024
