• DocumentCode
    3107010
  • Title

    Bivariate EMD analysis for aircraft component inspection

  • Author

    Leo, Marco ; D´Orazio, Tiziana ; Looney, David ; Mandic, Danilo P.

  • Author_Institution
    Inst. of Intell. Syst. for Autom., Italian Nat. Res. Council, Bari, Italy
  • fYear
    2010
  • fDate
    4-7 July 2010
  • Firstpage
    2797
  • Lastpage
    2802
  • Abstract
    In recent years many alternative methodologies and techniques have been proposed to perform non-destructive inspection and maintenance operations of moving structures. In particular, ultrasonic techniques have shown to be very promising for automatic inspection systems. From the literature, it is evident that neural paradigms are considered, by now, the best choice to automatically classify ultrasound data. At the same time the most appropriate pre-processing technique is still undecided. The aim of this paper is to propose a new and innovative data pre-processing technique that converts real-valued ultrasonic signals into complex-valued signals, making it suitable to apply phase synchrony analysis using complex extensions of Empirical Mode Decomposition (EMD), a data driven algorithm for detecting temporal scales in nonlinear and nonstationary data. Experimental tests aiming to detect defective areas in aircraft components are reported and the effectiveness of the proposed methodology is demonstrated.
  • Keywords
    acoustic signal processing; aircraft; flaw detection; inspection; signal classification; ultrasonic materials testing; vehicle dynamics; aircraft component inspection; automatic inspection system; bivariate EMD analysis; complex-valued signals; data driven algorithm; defective area detection; empirical mode decomposition; maintenance operation; moving structure; nondestructive inspection; nonlinear data; nonstationary data; phase synchrony analysis; real-valued ultrasonic signals; ultrasonic technique; ultrasound data classification; Acoustics; Frequency synchronization; Indexes; Inspection; Materials; Principal component analysis; Ultrasonic imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics (ISIE), 2010 IEEE International Symposium on
  • Conference_Location
    Bari
  • Print_ISBN
    978-1-4244-6390-9
  • Type

    conf

  • DOI
    10.1109/ISIE.2010.5636877
  • Filename
    5636877