DocumentCode
3107010
Title
Bivariate EMD analysis for aircraft component inspection
Author
Leo, Marco ; D´Orazio, Tiziana ; Looney, David ; Mandic, Danilo P.
Author_Institution
Inst. of Intell. Syst. for Autom., Italian Nat. Res. Council, Bari, Italy
fYear
2010
fDate
4-7 July 2010
Firstpage
2797
Lastpage
2802
Abstract
In recent years many alternative methodologies and techniques have been proposed to perform non-destructive inspection and maintenance operations of moving structures. In particular, ultrasonic techniques have shown to be very promising for automatic inspection systems. From the literature, it is evident that neural paradigms are considered, by now, the best choice to automatically classify ultrasound data. At the same time the most appropriate pre-processing technique is still undecided. The aim of this paper is to propose a new and innovative data pre-processing technique that converts real-valued ultrasonic signals into complex-valued signals, making it suitable to apply phase synchrony analysis using complex extensions of Empirical Mode Decomposition (EMD), a data driven algorithm for detecting temporal scales in nonlinear and nonstationary data. Experimental tests aiming to detect defective areas in aircraft components are reported and the effectiveness of the proposed methodology is demonstrated.
Keywords
acoustic signal processing; aircraft; flaw detection; inspection; signal classification; ultrasonic materials testing; vehicle dynamics; aircraft component inspection; automatic inspection system; bivariate EMD analysis; complex-valued signals; data driven algorithm; defective area detection; empirical mode decomposition; maintenance operation; moving structure; nondestructive inspection; nonlinear data; nonstationary data; phase synchrony analysis; real-valued ultrasonic signals; ultrasonic technique; ultrasound data classification; Acoustics; Frequency synchronization; Indexes; Inspection; Materials; Principal component analysis; Ultrasonic imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics (ISIE), 2010 IEEE International Symposium on
Conference_Location
Bari
Print_ISBN
978-1-4244-6390-9
Type
conf
DOI
10.1109/ISIE.2010.5636877
Filename
5636877
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