• DocumentCode
    3107616
  • Title

    Electrodeposited tin properties & their effect on component finish reliability

  • Author

    Schetty, Rob

  • Author_Institution
    Technic Adv. Technol. Div., Plainview, NY, USA
  • fYear
    2004
  • fDate
    Apr 27-30, 2004
  • Firstpage
    29
  • Lastpage
    34
  • Abstract
    Electrodeposited pure tin finishes on electronic components are a leading contender to replace the industry standard tin-lead. Since the electrodeposited finish directly influences the critical reliability characteristics of the component itself, the nature of the Pb-free component finish must be well characterized and understood. Only through a thorough examination of the attributes of the electroplated tin deposit can critical decisions be made regarding component finish reliability. This paper investigates the properties of electrodeposited tin that may have an effect on component reliability, namely, grain structure (size and shape), oxide formation, tin whisker formation, and solderability. Data is presented from laboratory and production settings, with the objective being to enable manufacturers to draw their own conclusions regarding previously established perceptions and misconceptions about electrodeposited tin properties.
  • Keywords
    circuit reliability; crystal orientation; electron device manufacture; electroplated coatings; grain size; internal stresses; oxidation; semiconductor device reliability; soldering; tin; whiskers (crystal); Sn; component finish reliability; crystal orientation; electrodeposited tin properties; electroplated deposit; grain shape; grain size; grain structure; internal stress levels; lead-free component finish; oxide formation; oxide resistance; solderability; tin whisker growth; Additives; Electronic equipment; Electronic equipment manufacture; Electronic equipment testing; Grain size; Lead; Manufacturing industries; Production; Shape; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Business of Electronic Product Reliability and Liability, 2004 International Conference on
  • Print_ISBN
    0-7803-8361-3
  • Type

    conf

  • DOI
    10.1109/BEPRL.2004.1308145
  • Filename
    1308145