• DocumentCode
    3108902
  • Title

    Stochastic model and drift dependence of long term stability of type N precision coaxial terminations

  • Author

    Yeou Song Lee

  • Author_Institution
    Anritsu Co., Morgan Hill, CA, USA
  • fYear
    2012
  • fDate
    29-30 Nov. 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper discusses a stochastic model fitting process for the determining the calibration interval of precision Type N coaxial terminations. The measurements were taken weekly and over a six month period. The calibration of the vector network analyzer employs one-port error correction model using a sliding load. The observed drift rate is computed using linear regression. A second-order drift was observed. This paper describes possible causes of this mechanism by analyzing the partial differential equations of the one-port error correction model. Discussions on the dependence of long term stability and calibration model are provided.
  • Keywords
    calibration; error correction; network analysers; partial differential equations; regression analysis; stability; stochastic processes; calibration interval; drift dependence; drift rate; linear regression; long term stability; one-port error correction model; partial differential equations; second-order drift; sliding load; stochastic model fitting process; type N precision coaxial terminations; vector network analyzer; Calibration; Differential equations; Equations; Mathematical model; Reflection coefficient; Stochastic processes; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Symposium (ARFTG), 2012 80th ARFTG
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4673-4817-1
  • Electronic_ISBN
    978-1-4673-4820-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.2012.6422436
  • Filename
    6422436