DocumentCode
3108902
Title
Stochastic model and drift dependence of long term stability of type N precision coaxial terminations
Author
Yeou Song Lee
Author_Institution
Anritsu Co., Morgan Hill, CA, USA
fYear
2012
fDate
29-30 Nov. 2012
Firstpage
1
Lastpage
5
Abstract
This paper discusses a stochastic model fitting process for the determining the calibration interval of precision Type N coaxial terminations. The measurements were taken weekly and over a six month period. The calibration of the vector network analyzer employs one-port error correction model using a sliding load. The observed drift rate is computed using linear regression. A second-order drift was observed. This paper describes possible causes of this mechanism by analyzing the partial differential equations of the one-port error correction model. Discussions on the dependence of long term stability and calibration model are provided.
Keywords
calibration; error correction; network analysers; partial differential equations; regression analysis; stability; stochastic processes; calibration interval; drift dependence; drift rate; linear regression; long term stability; one-port error correction model; partial differential equations; second-order drift; sliding load; stochastic model fitting process; type N precision coaxial terminations; vector network analyzer; Calibration; Differential equations; Equations; Mathematical model; Reflection coefficient; Stochastic processes; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurement Symposium (ARFTG), 2012 80th ARFTG
Conference_Location
San Diego, CA
Print_ISBN
978-1-4673-4817-1
Electronic_ISBN
978-1-4673-4820-1
Type
conf
DOI
10.1109/ARFTG.2012.6422436
Filename
6422436
Link To Document