DocumentCode :
3110457
Title :
Identification of system dynamics in presence of measurement noise
Author :
Pandey, Shishir ; Majhi, S.
Author_Institution :
Dept. of Electron. & Electr. Eng., Indian Inst. of Technol. Guwahati, Guwahati, India
fYear :
2013
fDate :
13-15 Dec. 2013
Firstpage :
1
Lastpage :
6
Abstract :
A technique for identification of system dynamics under the influence of measurement noise is presented. When output signal from sensor is corrupted by noise, identification of system parameters become an arduous task. Therefore, denoising methods can be employed in order to achieve a clean limit cycle under noisy environment. A Fast Fourier Transform (FFT) method has been reported as an effective technique for the mitigation of noise by an appropriate thresholding. Generalized explicit expressions are examined to obtain unknown plant model parameters for stable and unstable First Order Plus Dead Time (FOPDT) processes. Examples are illustrated to show the effectiveness of method during parametric identification of process models. Subsequently, a comparison is drawn between estimated and actual system through simulation by step test and Nyquist plot.
Keywords :
fast Fourier transforms; identification; signal denoising; FFT method; FOPDT processes; Nyquist plot; clean limit cycle; denoising methods; fast Fourier transform; generalized explicit expressions; measurement noise; noisy environment; output signal; parametric identification; plant model parameters; process models; sensor; system dynamics; thresholding; unstable first order plus dead time processes; Limit-cycles; Mathematical model; Noise; Noise measurement; Pollution measurement; Relays; Transfer functions; AWGN; Asymmetrical Relay; FFT; FOPDT; Identification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
India Conference (INDICON), 2013 Annual IEEE
Conference_Location :
Mumbai
Print_ISBN :
978-1-4799-2274-1
Type :
conf
DOI :
10.1109/INDCON.2013.6726001
Filename :
6726001
Link To Document :
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