DocumentCode
3110734
Title
Value of testability standards in testing commercial products
Author
Richards, David J.
Author_Institution
Digital Equipment Corp., Andover, MA, USA
fYear
1988
fDate
12-14 Sep 1988
Firstpage
201
Lastpage
202
Abstract
The author reviews the salient features of the proposed JTAG boundary-scan architecture design-for testability standard. The focus is on the standards utility in testing commercial products
Keywords
automatic test equipment; automatic testing; electronic equipment testing; measurement standards; production testing; JTAG boundary-scan architecture; commercial products; design-for testability standard; testability standards; Circuit testing; Complexity theory; Counting circuits; Design for testability; Integrated circuit interconnections; Logic design; Logic devices; Logic testing; Proposals; Standards organizations;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207801
Filename
207801
Link To Document