IC qualityd and test transparency

The authors examine the question of whether fault grading is necessary and if yes, how high the single-stuck fault coverage must be? They show that, not only is fault grading required, but that extremely high single stuck fault coverage is probable necessary. The results presented are extensions of previous work in this area by T.W. Williams (1985). The authors discuss only functional or Boolean testing, which does not involve measurement, but determines whether logic functions are correct. The question of how thorough a Boolean test procedure need be is the main focus. The need for extremely thorough testing is demonstrated